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dc.contributor.authorHu, Zhaoying
dc.contributor.authorTulevski, George S.
dc.contributor.authorHannon, James B.
dc.contributor.authorAfzali, Ali
dc.contributor.authorLiehr, Michael
dc.contributor.authorPark, Hongsik
dc.creator
dc.date.accessioned2017-03-01T14:47:41Z
dc.date.available2017-03-01T14:47:41Z
dc.date.issued2015
dc.identifier.citationHu, Z., Tulevski, G. S., Hannon, J. B., Afzali, A., Liehr, M., & Park, H. (2015). Variability and reliability analysis in self-assembled multichannel carbon nanotube field-effect transistors. Applied Physics Letters, 106, 243106. doi:10.1063/1.4922770en_US
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/1951/68950
dc.description.abstractCarbon nanotubes (CNTs) have been widely studied as a channel material of scaled transistors for high-speed and low-power logic applications. In order to have sufficient drive current, it is widely assumed that CNT-based logic devices will have multiple CNTs in each channel. Understanding the effects of the number of CNTs on device performance can aid in the design of CNT field-effect transistors (CNTFETs). We have fabricated multi-CNT-channel CNTFETs with an 80-nm channel length using precise self-assembly methods. We describe compact statistical models and Monte Carlo simulations to analyze failure probability and the variability of the on-state current and threshold voltage. The results show that multichannel CNTFETs are more resilient to process variation and random environmental fluctuations than single-CNT devices.en_US
dc.description.sponsorshipCollege of Nanoscale Science and Engineering, The State University of New York at Albany, Albany, New York 12203, USA, IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA, School of Electronics Engineering, Kyungpook National University, Daegu 702-701, South Koreaen_US
dc.language.isoen_USen_US
dc.publisherApplied Physics Lettersen_US
dc.subjectcarbon nanotubesen_US
dc.subjectchannel materialen_US
dc.subjectscaled transistoren_US
dc.subjecthigh-speed logic applicationen_US
dc.subjectlow-power logic applicationen_US
dc.subjectdrive currenten_US
dc.subjectlogic deviceen_US
dc.subjectfield-effect transistoren_US
dc.subjectself-assemblyen_US
dc.subjectcompact statistical modelen_US
dc.subjectMonte Carlo simulationen_US
dc.titleVariability and reliability analysis in self-assembled multichannel carbon nanotube field-effect transistorsen_US
dc.title.alternativeApplied Physics Lettersen_US
dc.typeArticleen_US


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