Browsing SUNY Polytechnic Institute Faculty and Staff Research, Publications, and Creative Works by Subject "electromigration"

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Modeling the copper microstructure and elastic anisotropy and studying its impact on reliability in nanoscale interconnects

Basavalingappa, Adarsh; Shen, Ming Y.; Lloyd, James R. (Mechanics of Advanced Materials and Modern Processes, 2017)

Copper is the primary metal used in integrated circuit manufacturing of today. Even though copper is face centered cubic it has significant mechanical anisotropy depending on the crystallographic orientations. Copper metal ...