Browsing Colleges of Nanoscale Science and Engineering Doctoral Dissertations by Subject "optical characterization methods"

Now showing items 1-1 of 1

Characterization and Control of the Surface of the Topological Insulator Bi2Se3

Green, Avery James; Diebold, Alain; Advisor (2017-12)

The field of topological insulator (TI) materials is new. The ideal TI contains surface states in helical Dirac cones that can be used for spintronics or interconnect applications. Of the TI class, Bi2Se3 is the most ...