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dc.contributor.advisorR, Sekaren_US
dc.contributor.authorAyyangar, Arvind Narasimhanen_US
dc.contributor.otherDepartment of Computer Scienceen_US
dc.date.accessioned2012-05-11T13:35:00Z
dc.date.available2012-05-11T13:35:00Z
dc.date.issued1-Aug-10en_US
dc.date.submitted1-Aug-10en_US
dc.identifierAyyangar_grad.sunysb_0771M_10271.pdfen_US
dc.identifier.urihttp://hdl.handle.net/1951/53476
dc.description.abstractDisassembly of binaries plays an important role in computer security.Tools for binary analysis and reverse engineering rely heavily on staticdisassembly. Current disassemblers are not able to reliably disassembleexecutables or libraries that contain data (or junk bytes) in the midst ofcode, or make extensive use of indirect jumps or calls. These features cancause these tools to fail silently, thus making them inappropriate forapplications that critically depend on correct disassembly, e.g., binaryinstrumentation. An incorrectly disassembled binary can lead to incorrectinstrumentation, which can in turn cause the instrumented program to fail,or more generally, exhibit differences in behavior from the originalbinary. In this thesis, we analyze existing disassembly approaches, theirshortcomings, and propose a technique to overcome these shortcomings. Weinvestigate the use of static data flow analysis and type analysis toovercome the many challenges posed by disassembly of commercial off-the-shelfsoftware binaries.en_US
dc.description.sponsorshipStony Brook University Libraries. SBU Graduate School in Department of Computer Science. Lawrence Martin (Dean of Graduate School).en_US
dc.formatElectronic Resourceen_US
dc.language.isoen_USen_US
dc.publisherThe Graduate School, Stony Brook University: Stony Brook, NY.en_US
dc.subject.otherbinary, disassembly, intra-procedural data flow, security, ssa, type analysisen_US
dc.titleStatic Disassembly Of Stripped Binariesen_US
dc.typeThesisen_US
dc.description.advisorAdvisor(s): Sekar R. Committee Member(s): Robert Johnson; C R. Ramakrishnan.en_US
dc.mimetypeApplication/PDFen_US


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