Browsing by Author "Sarkar, Vishwanath"

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Defect characterization and stress analysis by white beam synchrotron X-ray topography in single crystal semiconducting materials

Sarkar, Vishwanath (The Graduate School, Stony Brook University: Stony Brook, NY., 1-Dec-11)

Semiconductor devices are becoming increasingly more complex as the number of transistors increases in the same Integrated Circuit (IC) area. Due to the complexity in design; processing and packaging of the device plays a ...